In his chapter on Physics and Applications of Semiconductor Nanowire Lasers, common features, design rules, seminal works and an outlook for future development are provided.
Patrick gave a virtual presentation on “High-Throughput Correlative Microscopy and Spectroscopy for Nano-Laser Development” in the CT05 “AI and Automation for Materials Design” session.
Group PhD student Stefan Skalsky’s paper on semiconductor nanowire lasing has just been published in Light: Science and Applications. In this new work, Stefan used his newly developed Interferometric Time-Correlated Single Photon Counting system (i-TCSPC) to measure the coherence length of laser emission from nanowires grown by the Liu group at UCL. These measurements allowed the direct calculation of the nanowire mirror reflectivity.
During this study, Stefan found that it was possible to use indirect bandgap materials as a holding state for carriers before they relax into the emissive wells; this finding both allows multi-nanosecond lasing after a sub-picosecond excitation, and record low lasing thresholds through resonant excitation.
This work was supported by TEM provided by the Sanchez group at Warwick.
Reference: Heterostructure and Q-factor engineering for low-threshold and persistent nanowire lasing, Skalsky et al., Light: Science and Applications, 9, 43 (2020) https://doi.org/10.1038/s41377-020-0279-y
Patrick gave an invited talk at Photonics West 2020 in San Francisco, in the session Novel Nano Structure. This talk convered recent work on ultra-low threshold nanowire lasers and experimental end-cavity reflectivity measurements in nanoscale systems.
Arturo has had a paper accepted for publication in Nanoscale Advances, describing the impact of the transfer process on the morphology and threshold of semiconductor nanowire lasers.
While many studies have sought to improve the threshold for lasing in semiconductor nanowire lasers, the role of process has not been significantly considered. By applying a large-scale population study to this system, Arturo has used statistical tools to identify the optimal processing methods which is transferrable to a wide varity of nanowire laser structures.
Reference: “Threshold reduction and yield improvement of semiconductor nanowire lasers via processing-related end-facet optimization“, J. A. Alanis et al., Nanoscale Advances, 2019 (10.1039/C9NA00479C)