New Paper: Defect-Free Axially Stacked GaAs/GaAsP Nanowire Quantum Dots with Strong Carrier Confinement

Transmission electron microscopy and room-temperature photoluminescence of a dot-in-wire structure.

In a new collaboration between Yunyan Zhang and Profs. Huiyun Liu (UCL), Ana Sanchez (Warwick) and David Mowbray (Sheffield) we report the fabrication and measurement of a GaAs/GaAsP quantum dot-in-wire structure in Nano Letters.

While many material architechtures have been explored for single photon emission, the GaAsP-GaAs system provides strong carrier confinement and sharp interfaces, and can be grown directly onto a silicon substrate. This is a new route to silicon integrated single photon devices.

Reference: Defect-Free Axially Stacked GaAs/GaAsP Nanowire Quantum Dots with Strong Carrier Confinement, Yunyan Zhang, Anton V. Velichko, H. Aruni Fonseka, Patrick Parkinson, James A. Gott, George Davis, Martin Aagesen, Ana M. Sanchez, David Mowbray, and Huiyun Liu, Nano Lett. (2021), DOI: 10.1021/acs.nanolett.1c01461