Research: XRF and XEOL at ESRF

Patrick, Stephen and Nikesh visited the ID16 beamline at ESRF Grenoble to carry out nano X-ray imaging. This was led by Dr Valentina Bonino, beamline scientist; four 24 hour shifts were used to measure combine XRF (X-Ray Fluorescence) and XEOL (X-Ray excited optical luminescence) with 60nm resolution on doped and heterostructured nanowires. This work will explain distribution of dopants in nanowires towards future devices, and was funded by ESRF.