New Paper: Wafer-scale correlated morphology and optoelectronic properties in GaAs/AlGaAs core–shell nanowires

Group PhD student Ishika Das had her first paper accepted in APL Materials. This work, led by Stephen Church in collaboration with Prof. Fumitaro Ishikawa at the University of Hokkaido, reported on wafer-scale characterization of nanowire growth. This work provides a route to understand homogeneity and uniformity at the full wafer scale.

Reference: Wafer-scale correlated morphology and optoelectronic properties in GaAs/AlGaAs core–shell nanowires, Das et al. APL Materials, 2025, 13, 061116, https://doi.org/10.1063/5.0258062